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[mailto:arguicha@stanford.edu Alex Guichard]

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Education:

B.Sc. Materials Science and Engineering, North Carolina State University (2003)

Research interest:

Optical properties of semiconductor nanostructures

Publications

1. A.R. Guichard, R.D. Kekatpure, M.L. Brongersma, Temperature-dependent Auger recombination dynamics in luminescent Si nanowires, in prep

2. R.D. Kekatpure, A.R. Guichard, M.L. Brongersma, Fabrication and theoretical modeling of High Q, Silica microdisc cavities containing Si nanocrystals, in prep

3. D.M. Gudai, A.R. Guichard, M.L. Brongersma. Synthesis of Cobalt-catalyzed Silicon Nanowires by Chemical Vapor Deposition, in prep

4. A.R. Guichard, R.D. Kekatpure, M.L. Brongersma. Auger Recombination in Luminescent, CMOS-compatible Si Nanowires, 4th IEEE International Conference on Group IV Photonics, 2007

5. A.R. Guichard, D.N. Barsic, T.I. Kamins, S. Sharma, M.L. Brongersma. Light Emission from Quantum-Confined Excitons in Silicon Nanowires Grown via Chemical Vapor Deposition, Nano Letters, 6, 2140 (2006)

6. A.R. Guichard, T.I. Kamins, S. Sharma, M.L. Brongersma. Light Emitting Silicon Nanowires for Photonic Device Applications, 3rd IEEE International Conference on Group IV Photonics, 137 (2006)

7. A.R. Guichard, D.N. Barsic, T.I. Kamins, S. Sharma, M.L. Brongersma. Size and Temperature Dependent Photophysics of Si Nanowires, Materials Research Society (MRS), Spring meeting, San Francisco, CA, April 18, 2006

8. A.R. Guichard, D.N. Barsic, M.L. Brongersma. Growth, Structural and Optical Characterization of Si nanowires, invited seminar, Department of Materials Science and Engineering, North Carolina State University, December 19, 2005

9. A.R. Guichard, D.N. Barsic, T.I. Kamins, S. Sharma, M.L. Brongersma. Size-dependence of the optical properties of Si nanowires, SPIE Optics & Photonics, San Diego, CA, August 1, 2005

10. A.R. Guichard, D.N. Barsic, T.I. Kamins, S. Sharma, M.L. Brongersma. The photophysics of Si nanowires grown via Chemical Vapor Deposition (CVD). Materials Research Society (MRS), Spring meeting, San Francisco, CA, March 29, 2005

11. K.F. Jarausch, J.F. Richards, A.R. Guichard, L. Denney, P.E. Russell. Site-Specific 2-D Implant profiling using FIB assisted SCM. International Soc. of Test and Failure Analysis (ISTFA28th), Pheonix, Az, Nov 4, 2002.

12. A.R. Guichard, K.F. Jarausch, J.F. Richards, L. Denney, P.E. Russell. Site-Specific 2D Implant Profiling using FIB-assisted SCM, Appalachian Regional Microscopy Society (AReMS2002), Poster Presentation. Boone, NC, Oct. 3, 2002

13. P.E. Russell, A.R. Guichard, J. Wang, K.L. Bunker, J.C. Perez-Gonzolez, D.P. Griffis. Nanofabrication and Analysis with Ion and Electron Beams, Materials Research Society (MRS-Y4.5), Boston, MA, Nov. 25, 2001

14. Wang, J., Guichard, A., Griffis D.P., Russell, P.E. Recent Progress in Electron Beam-Induced Chemistry, International Vacuum Congress (IVS15th), San Francisco, CA, Oct 28, 2001

15. A.R. Guichard, P.E. Russell, J. Wang. Electron Beam-Induced Chemistry, Undergraduate Research Symposium, NC State University, Poster Presentation. March 2001

16. P.E. Russell, M.E. Salmon, A.R. Guichard, J. Griffith. Atomic Force Microscopy and other Scanned Probe Microscopies. Lehigh University Microscopy School, Course text, June 2000-2002